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| D Accelerators and radiation-light utilizing machine products |
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| ■ In-situ Polarized Light Total Reflection Fluorescent XAFS Instrument |
| ●Outline |
| ■ This device is used for three-dimensional structural analysis of chemical species such as catalytic activation spots that are highly dispersed on a surface, using synchrotron radiation X-rays under in-situ conditions. This device is for surface structure analysis and can be used for local structural analysis that does not require long-distance regularity. |
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■Actual installation : The University of Tokyo |
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